主要规格及技术指标 : TEM resolution (at 200 kV) Point image 0.19 nm Lattice image 0.1 nm STEM resolution (at 200 kV) Dark-field lattice image 0.14 nm*1 Brightness (at 200 kV) 8×108A/cm2･sr or higher Degree of vacuum 1 × 10-8 Pa or less (at the bottom of the acceleration tube) TEM magnification (at 200 kV) MAG ×2000 to 2.0 M LOWMAG(OL OFF mode) ×20 to ×60 k SCAN magnification (at 200 kV) MAG ×20 k to 150 M LOW MAG(OL OFF mode) ×100 to 2.0 M Supported detectors STEM-DF, STEM-BF

主要功能及特色 : TEM, HRTEM, STEM, SAED measurement for the mophorlogy and crystal structure of nanomaterials and bio-samples

主要附件及配置 : Accelerate voltage 80kV, 200kV， Ultramicrotome for bio-samples preparation.

应用范围 :

备注 :